resonance modes and data acquisition modules. It provides STEP for measuring and modeling electromechanical response curves and fitting empirical models for piezoelectric, ferroelectric, electrostrictive, and antiferroelectric materials, including optional hardware components for high-voltage measurements. TASI Technical Software also offers Piezo1D to model one-dimensional electromechanical devices using Mason and KLM network models to predict frequency-dependent performance. In addition, XRFWin controls x-ray spectrometers and performs qualitative and quantitative x-ray fluorescence spectroscopy, including single- and multi-layer composition and thickness determination. Its products run on Windows platforms and support direct instrument control through integrated drivers and abstraction layers.