82
28
Growth Score
-3 pts
Heat Score
-3 pts
Company Performance Metrics
Score
Trend
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Growth Score - The measure of growth based on company activity, operational metrics, and investments
Growth Trend - The change in the growth score over the given time period
Heat Score - The measure of the market interest, media activity, and Crunchbase profile activity
Heat Trend - The change in the heat score over the given time period
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841095
In-line Semiconductor N2 Process Critical Dimension X-ray metrology Tool (XRCD)
Bo-Ching He: CTO- Chun-Ting Liu: CEO
About the Company
Our metrology tool can measure the N2 semiconductor process multilayer GAA structure and monitor critical dimensions with atomic-level resolution. Compared with its competitors, the tool has reduced measurement time by 90%. The target market includes foundry and memory below semiconductor N2 node.
Technology:
https://www.youtube.com/watch?v=sDt7l4wBQnQ
