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Tempus F-20

Enabling massively parallel screening of materials and process, this tool is used for library creation as well as processing wafer coupons. It is ideal for primary and or secondary combinatorial screening, enabling the user to generate thousands of characterizations with reduced resource requirements. The Tempus F-20 supports testing on both wafer coupons as well as within a vial block.

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Last Edited 6/24/09

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