|Description||semiconductor metrology equipment|
|Venture Round, 10/2007 |
Jordan Valley Semiconductors, Inc. engages in the research, development, and manufacture of semiconductor metrology equipment and solutions for thin films based X-ray technology. It offers solutions for thin-film and in-line product wafer measurements based on advanced X-ray reflectivity, X-ray fluorescence, and high resolution X-ray diffractometry technologies. Its X-ray technology enables accurate and precise characterization of films, including single and multi-layer stacks, high k and low k materials, metals and dielectrics, amorphous, poly-crystal, and single crystal films. The companyâ€™s products are used in barrier and seed layers; interconnect metals; strain metrology; hi-k and metal gate; UBM, RDL, and bumps; thin film microstructure; silicides; GMR, MRAM, and HDD; crystalline defect inspection; and front end and back end of line applications. It offers its products for semiconductor manufacturers in the United States and internationally.
Jordan Valley Semiconductors, Inc. was founded in 1982 and is based in Austin, Texas with manufacturing facilities in Migdal Ha’Emek, Israel; and Durham, the United Kingdom, as well as a research and development center in Migdal Ha’Emek, Israel. It has sales and customer support offices in Austin, Texas, as well as in Asia and Europe.